The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2012

Filed:

Sep. 14, 2010
Applicants:

Lam Huy Nguyen, Laurel, MD (US);

Jeffrey P. Sichina, Ocean View, DE (US);

Inventors:

Lam Huy Nguyen, Laurel, MD (US);

Jeffrey P. Sichina, Ocean View, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for generating images from projection data comprising inputting first values representing correlated positional and recorded data; forming an image by processing the projection data utilizing a pixel characterization imaging subsystem to form the SAR imagery utilizing one of a back-projection algorithm or range migration algorithm; integrating positional and recorded data from many aperture positions, comprising: forming the complete aperture Acomprising collecting the return radar data, the coordinates of the receiver, and the coordinates of the transmitter for each position k along the aperture of N positions; forming an imaging grid comprising M image pixels; selecting and removing a substantial number of aperture positions to form a sparse aperture Afor L iterations; classifying each pixel in the image into target class based on the statistical distribution of its amplitude across L iterations; otherwise, the pixel is given the value of zero.


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