The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2012

Filed:

May. 12, 2008
Applicants:

Akira Tsukamoto, Toda, JP;

Daisuke Suzuki, Kokubunji, JP;

Akihiko Kandori, Tokyo, JP;

Inventors:

Akira Tsukamoto, Toda, JP;

Daisuke Suzuki, Kokubunji, JP;

Akihiko Kandori, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/553 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

Accurate measurement cannot be performed due to magnetic signals from magnetic impurities included in a specimen container. By finding a difference between two measurement signals obtained by applying an external magnetic field for orientation to respective normal and reverse directions, the magnetic signals from the magnetic impurities included in the specimen container which are not dependent on the external magnetic field for orientation can be cancelled. The influence of the magnetic impurities included in the specimen container is reduced, and the signal of the intended bound magnetic marker can be measured with high sensitivity.


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