The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8192864 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 05, 2012

Filed:

Feb. 01, 2008
Applicants:

Hideharu Takezawa, Nara, JP;

Takayuki Shirane, Osaka, JP;

Shinya Fujimura, Osaka, JP;

Sadayuki Okazaki, Osaka, JP;

Kazuyoshi Honda, Osaka, JP;

Inventors:

Hideharu Takezawa, Nara, JP;

Takayuki Shirane, Osaka, JP;

Shinya Fujimura, Osaka, JP;

Sadayuki Okazaki, Osaka, JP;

Kazuyoshi Honda, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for examining a negative electrode of a battery, a total thickness of a current collector and an active material layer is measured. Then, in order to estimate a composition of the active material layer, the total resistivity of the current collector and the active material layer is measured.


Find Patent Forward Citations

Takezawa, Hideharu. (2012). Battery, examination method and manufacturing method for negative electrode thereof, and examination apparatus and manufacturing apparatus for negative electrode thereof (U.S. Patent No. 8192864). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8192864

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