The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8190972 B1

PDF
Full Text
Expired
Date of Patent:
May. 29, 2012

Filed:

Sep. 15, 2008
Applicants:

Nahum N. Vishne, Elad, IL;

Alex Shinkar, Rishon-Lezion, IL;

Inventors:

Nahum N. Vishne, Elad, IL;

Alex Shinkar, Rishon-Lezion, IL;

Assignee:

LSI Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method to write data with error checking and correction overlap ranges is disclosed. The method generally includes the steps of (A) receiving plurality of input numbers in a plurality of input signals, (B) generating a plurality of error correction codes by separately operating on each of a plurality of unique pairs of the input numbers, wherein each of the error correction codes is configured to correct at least one error in a corresponding one of the unique pairs and (C) storing the input numbers and the error correction codes in a memory.


Find Patent Forward Citations

Vishne, Nahum. (2012). Error checking and correction overlap ranges (U.S. Patent No. 8190972). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8190972

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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