The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2012

Filed:

Aug. 18, 2008
Applicants:

Hiroshi Kitaguchi, Naka, JP;

Takahiro Tadokoro, Hitachi, JP;

Akihisa Kaihara, Hitachi, JP;

Inventors:

Hiroshi Kitaguchi, Naka, JP;

Takahiro Tadokoro, Hitachi, JP;

Akihisa Kaihara, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

At a worksite of a client, progeny nuclides of radon and thoron are collected into a filter, then making the gross measurement on α-ray amount within an hour from the collection. Next, the filter is sent to an analysis center with information added thereto, such as collection-condition information, gross-measurement information, and sampling-worksite information. At the analysis center, the gross measurement on the filter sent thereto is made again. Also, the radioactive-nuclide analysis is made to perform evaluation of the radioactivity intensity. Moreover, radon amount and thoron amount at the measurement-specimen sampling points-in-time at the worksite are calculated, then reporting the analysis result of the radon and thoron amounts to the client.


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