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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8190391 B1

PDFFull Text
Expired
Date of Patent:
May. 29, 2012

Filed:

Mar. 29, 2007

Determining die performance by incorporating neighboring die performance metrics

Applicants:

Daniel Kadosh, Austin, TX (US);

Gregory A. Cherry, Kyle, TX (US);

Carl I. Bowen, Austin, TX (US);

Luis DE LA Fuente, Austin, TX (US);

Rajesh Vijayaraghavan, Austin, TX (US);

Inventors:

Daniel Kadosh, Austin, TX (US);

Gregory A. Cherry, Kyle, TX (US);

Carl I. Bowen, Austin, TX (US);

Luis De La Fuente, Austin, TX (US);

Rajesh Vijayaraghavan, Austin, TX (US);

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:

Williams, Morgan & Amerson, P.C.

Primary Examiner:

Michael Nghiem

Assistant Examiner:

Ricky Ngon

Int. Cl.
CPC ...
G01R 15/00 (2006.01); G01R 29/00 (2006.01); G01R 31/26 (2006.01); G01N 37/00 (2006.01); H01L 21/66 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes receiving a first set of parameters associated with a plurality of die. A first die performance metric associated with a selected die is determined based on the first set of parameters. At least one neighborhood die performance metric associated with a set comprised of a plurality of die that neighbor the selected die is determined based on the first set of parameters. A second die performance metric is determined for the selected die based on the first die performance metric and the neighborhood die performance metric.

Find Patent Forward Citations

Kadosh, Daniel. (2012). Determining die performance by incorporating neighboring die performance metrics (U.S. Patent No. 8190391). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8190391

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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