The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Oct. 03, 2011
Yen-hung Chen, Ann Arbor, MI (US);
Xiangchun Zhang, Ann Arbor, MI (US);
Chia-wei Wang, Ypsilanti, MI (US);
Ann Marie Sastry, Ypsilanti, MI (US);
Yen-Hung Chen, Ann Arbor, MI (US);
Xiangchun Zhang, Ann Arbor, MI (US);
Chia-Wei Wang, Ypsilanti, MI (US);
Ann Marie Sastry, Ypsilanti, MI (US);
Sakti3, Inc., Ann Arbor, MI (US);
Abstract
A method of determining at least one material property of at least one component of an electrochemical system (fully or partially completed) using a process to reduce a difference of a performance characteristic between a numerical simulation result of a physical model and an empirical result. The method includes providing an electrochemical cell using a thin film process and performing a plurality of tests on the electrochemical cell to identify one or more target performance characteristics of the electrochemical cell. The method includes performing a surrogate based analysis process and determining a plurality of outputs of the surrogate based analysis function and determines a value of the unknown material property.