The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Jun. 19, 2009
Yasushi Nakazato, Tokyo, JP;
Osamu Satoh, Sagamihara, JP;
Kohji Ue, Ebina, JP;
Masahide Yamashita, Tokyo, JP;
Jun Yamane, Yokohama, JP;
Yasushi Nakazato, Tokyo, JP;
Osamu Satoh, Sagamihara, JP;
Kohji Ue, Ebina, JP;
Masahide Yamashita, Tokyo, JP;
Jun Yamane, Yokohama, JP;
Ricoh Company, Limited, Tokyo, JP;
Abstract
A fault prediction method predicts a plurality of faults in a target device, and includes the steps of collecting internal information of the target device output from the target device, generating one or more criteria for defining a deviation from a normal state based on the collected internal information of the target device, incorporating the one or more criteria into a device state discriminator, identifying a deviation from a normal state in the target device according to the one or more criteria using the device state discriminator, and outputting a fault prediction as a result of the identifying step to a user. One or more of the steps are performed by a processor.