The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Oct. 05, 2009
Applicants:
Ryan Edward Sullivan, Yardley, PA (US);
Qingxiong LI, Newark, DE (US);
Xin Jack Zhou, Hockessin, DE (US);
Sean Xiaolu Wang, Wilmington, DE (US);
Inventors:
Ryan Edward Sullivan, Yardley, PA (US);
Qingxiong Li, Newark, DE (US);
Xin Jack Zhou, Hockessin, DE (US);
Sean Xiaolu Wang, Wilmington, DE (US);
Assignee:
BWT Property, Inc., Newark, DE (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A fiber spectroscopic probe that can be mounted directly above the objective lens of a standard microscope to add a spectroscopic function to the microscope. The fiber spectroscopic probe only consists of a minimum number of optical components and is compact enough to induce minimum alteration to the optical path of the microscope.