The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Dec. 12, 2008
Chien-nan Yu, Taipei, TW;
Szu-hao Lyu, Taipei, TW;
Chien-Nan Yu, Taipei, TW;
Szu-Hao Lyu, Taipei, TW;
Primax Electronics Ltd., Taipei, TW;
Abstract
A focus-quality judging method includes the following steps. Firstly, a comparing object including a target area is provided. A reference image pickup device is provided to shoot the comparing object to obtain a standard image including a standard target area image. Then, a first pixel number contained in the standard target area image is counted. The comparing object is shot by a test image pickup device to obtain a test image including a test target area image, wherein the test image has the same resolution as the standard image. Then, a second pixel number contained in the test target area image is counted. The first pixel number contained in the standard target area image is compared with the second pixel number contained in the test target area image. According to the comparing results, it is discriminated whether the test image pickup device performs an accurate focusing operation.