The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2012

Filed:

Oct. 16, 2006
Applicant:

Hisashi Okugawa, Yokosoka, JP;

Inventor:

Hisashi Okugawa, Yokosoka, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A confocal microscope apparatus is capable of obtaining a high confocal effect while detecting an image of a specimen line by line. The confocal microscope apparatus may include an illuminating optical system which illuminates a line-shaped area on a specimen plane in a specimen by collected light, an image-forming optical system which forms an image of light emitted from the specimen plane, a two-dimensional light detector which is placed at a conjugate plane of the specimen plane, a scanning unit which moves the line-shaped area on the specimen plane, and a correcting unit which corrects a pixel signal of a specific line on the two-dimensional light detector having a confocal relation with the line-shaped area based on a pixel signal of a peripheral line of the specific line.


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