The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Apr. 11, 2008
Wolf Delong, Erlangen, DE;
Wolf Delong, Erlangen, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
A segmentation method includes several steps wherein a single data space is selected by the user in an n-dimensional feature space in a first step. This selected data space is basically interpreted by the system as containing at least two classes of objects to be segmented. In the following steps, the system first determines a separation function in the n-dimensional feature space for differentiating the at least two classes and then applies this separation function to the entire data space or a large part of the data space. The segmentation result is then visually presented to the user in real time. The invention also relates to a method for classifying objects on the basis of geometric characteristics of objects previously segmented according to any method in an n-dimensional data space. In a first step, at least two objects are selected as representatives of two different categories, then a number (m) of geometric characteristics per object is determined by calculating various whole-number wave functions. Then, the objects are classified on the basis of the defined number of geometric characteristics or partial quantities. The previously required segmentation of the objects can be carried out according to the inventive method.