The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Jun. 15, 2005
Applicant:
Steffen Leidenbach, Gleichen, DE;
Inventor:
Steffen Leidenbach, Gleichen, DE;
Assignee:
Carl Zeiss MicroImaging GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The object in a program-controlled microscope and method for the external control of microscopes is to ensure the availability of externally generated data independent from the external control device generating the data. The microscope has an interface by which data which are generated externally by the control device and which are not provided in the control program internal to the microscope are stored in and/or read out from a storage internal to the microscope.