The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
May. 21, 2007
Jian Zhang, Chapel Hill, NC (US);
Jianping LU, Chapel Hill, NC (US);
Otto Z. Zhou, Chapel Hill, NC (US);
David Lalush, Cary, NC (US);
Jian Zhang, Chapel Hill, NC (US);
Jianping Lu, Chapel Hill, NC (US);
Otto Z. Zhou, Chapel Hill, NC (US);
David Lalush, Cary, NC (US);
The University of North Carolina at Chapel Hill, Chapel Hill, NC (US);
North Carolina State University, Raleigh, NC (US);
Abstract
Methods, systems, and computer program products for binary multiplexing x-ray radiography are disclosed. According to one aspect, the subject matter described herein can include irradiating an object with composite x-ray beams including signals based on a predetermined binary transform. Further, the subject matter described herein can include detecting x-ray intensities associated with the signals of the composite x-ray beams. An inverse binary transform can be applied to the detected x-ray intensities associated with the signals of the composite x-ray beams to recover the signals of the composite x-ray beams.