The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
May. 05, 2008
Takashi Kikukawa, Tokyo, JP;
Hidetake Itoh, Tokyo, JP;
Takashi Kikukawa, Tokyo, JP;
Hidetake Itoh, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
A signal quality evaluation method is provided that can objectively evaluate signal quality regardless of a PRML detection method used. The signal quality evaluation method is used when recording and reading is performed by irradiating a medium with a laser beam having a wavelength of λ through an objective lens having a numerical aperture of NA. In the signal quality evaluation method, information of the difference between an ideal signal recoded in the medium and a real signal obtained by irradiating the medium with the laser beam is statistically analyzed for each signal level of the ideal signal. The evaluation of the quality of the real signal is made using the statistics obtained by the statistical analysis.