The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Mar. 27, 2007
Yoshihisa Adachi, Kyoto, JP;
Shigemi Maeda, Yamatokoriyama, JP;
Atsushi Etoh, Tenri, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
A recording parameter setting device includes a trial recording parameter setting section and a reproduced signal quality judging section. The trial recording parameter setting section sets a trial recording parameter capable of controlling a heat level at least rear edges of recording marks, classified in accordance with recording mark lengths, and grouping a predetermined recording mark length or longer into a same group. The reproduced signal quality judging section judges whether a trial recording carried out in accordance with the trial recording parameter satisfies a predetermined reproduced signal quality. If the signal quality is unsatisfactory, the trial recording parameters of the predetermined recording mark length or longer are regrouped and trial recording is carried out again until the reproduced signal satisfies the predetermined signal quality. Then, the reproduced signal quality judging section sets the trial recording parameter as the recording parameter.