The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2012

Filed:

Oct. 01, 2009
Applicants:

Charles W. Robertson, Jr., Centreville, DE (US);

Catherine T. Williams, Kennett Square, PA (US);

Jonathan Pundt, Verona, WI (US);

Inventors:

Charles W. Robertson, Jr., Centreville, DE (US);

Catherine T. Williams, Kennett Square, PA (US);

Jonathan Pundt, Verona, WI (US);

Assignee:

Nanodrop Technologies, LLC, Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A dual-mode method and apparatus of selectively measuring samples in either a vessel or as a surface tension retained sample held between two opposing pedestals is introduced. In either configuration, such modes further contain optical paths from a source system through a small-volume or large-volume sample to a spectrometer based system. Such a system enables a user to measure samples with absorbances ranging from about 0.005 up to about 2.0 Absorbance Units for any given wavelength.


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