The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8189190 B1

PDF
Full Text
Expired
Date of Patent:
May. 29, 2012

Filed:

Nov. 02, 2007
Applicant:

Dennis R. Alexander, Lincoln, NE (US);

Inventor:

Dennis R. Alexander, Lincoln, NE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are provided for monitoring materials using ultra fast laser pulses. Ultra fast laser pulses, such as femtosecond or attosecond laser pulses, are applied to the materials and laser pulses that result from interactions between the ultra fast laser pulses and the materials are collected. Spectral content of the resulting pulses is generated and presented. The elemental composition of the materials is determined using the spectral content.


Find Patent Forward Citations

Alexander, Dennis. (2012). Remote chemical and elemental analysis by ultra fast spectroscopy (U.S. Patent No. 8189190). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8189190

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