The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Oct. 16, 2009
Hsueh-ching Shih, Taipei County, TW;
Jia-huey Tsao, Taipei County, TW;
Chih-cheng Feng, Taipei County, TW;
Chun-lin Chiang, Taipei County, TW;
Chun-min Su, Taichung County, TW;
Kuo-chi Chiu, Hsinchu County, TW;
Hsueh-Ching Shih, Taipei County, TW;
Jia-Huey Tsao, Taipei County, TW;
Chih-Cheng Feng, Taipei County, TW;
Chun-Lin Chiang, Taipei County, TW;
Chun-Min Su, Taichung County, TW;
Kuo-Chi Chiu, Hsinchu County, TW;
Industrial Technology Research Institute, Hsin-Chu, TW;
Abstract
An optical inspection apparatus capable of adjusting an incident angle of a detected light beam and adjusting a detecting angle for detecting the detected light beam. A driving mechanism is used to actuate two arms having a light source and a detector disposed thereon respectively to conduct a relative movement between the two arms so as to control the incident angle and the detecting angle. By means of the embodiments, mechanism for adjusting the angle is simplified so that the apparatus is capable of being adapted to combine with the application of micro sensors such that practicality of modularization design and microminiaturization and convenience of operation are capable of being greatly improved and that the cost can be reduced.