The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2012

Filed:

Oct. 22, 2010
Applicant:

Patrick Henkel, Emmering, DE;

Inventor:

Patrick Henkel, Emmering, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 19/03 (2010.01);
U.S. Cl.
CPC ...
Abstract

A method for estimating satellite-satellite single difference biases is described. The method uses an ionosphere-free mixed code-carrier combination of maximum ambiguities discrimination defined at the ration between wavelength and noise standard deviation. The accuracy of the biases estimation is further improved by an additional ionosphere-free mixed code-carrier combination of time-difference measurement that is uncorrelated with the first combination. Finally, an alternative method is based on a combination of carrier signals in a common frequency band which allows estimating the biases individually.


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