The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Aug. 30, 2007
Eiji Yoshida, Chiba, JP;
Kengo Shibuya, Chiba, JP;
Taiga Yamaya, Chiba, JP;
Hideo Murayama, Chiba, JP;
Keishi Kitamura, Kyoto, JP;
Eiji Yoshida, Chiba, JP;
Kengo Shibuya, Chiba, JP;
Taiga Yamaya, Chiba, JP;
Hideo Murayama, Chiba, JP;
Keishi Kitamura, Kyoto, JP;
National Institute of Radiological Sciences, Chiba-shi, JP;
Shimadzu Corporation, Kyoto-shi, JP;
Abstract
Upon detection of radiation by using a (three-dimensional) detector capable of distinguishing a detection position in a depth direction and energy, an energy window for distinguishing between a signal and noise is changed depending on the detection position in the depth direction, thus making it possible to obtain scattering components inside the detector. Alternatively, a weight is given to a detection event depending on the detection position in the depth direction and energy information to obtain scattering components inside the detector. Thereby, scattering components inside the detector can be obtained to increase the sensitivity of the detector. In this case, different detecting elements can be used depending on the detection position in the depth direction.