The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Sep. 08, 2008
Ilshat Gubaydullin, Ludwigshafen, DE;
Karl-heinz Wassmer, Mutterstadt, DE;
Robert Rupaner, Ellerstadt, DE;
Jochen Kessler, Hassloch, DE;
Guillermo Arens, Frankenthal, DE;
Gerald Wildburg, Speyer, DE;
Christian Magin, Schifferstadt, DE;
Wolfgang Huemmer, Birkenheide, DE;
Lambertus Manders, Ludwigshafen, DE;
Rudolf Schuhmacher, Boehl-Iggelheim, DE;
Oliver Birkert, Fussgoennheim, DE;
Ilshat Gubaydullin, Ludwigshafen, DE;
Karl-Heinz Wassmer, Mutterstadt, DE;
Robert Rupaner, Ellerstadt, DE;
Jochen Kessler, Hassloch, DE;
Guillermo Arens, Frankenthal, DE;
Gerald Wildburg, Speyer, DE;
Christian Magin, Schifferstadt, DE;
Wolfgang Huemmer, Birkenheide, DE;
Lambertus Manders, Ludwigshafen, DE;
Rudolf Schuhmacher, Boehl-Iggelheim, DE;
Oliver Birkert, Fussgoennheim, DE;
BASF SE, Ludwigshafen, DE;
Abstract
The present invention relates to a method for performing a polymerization process in a stirred reactor, wherein a critical time window is determined by means of a monitor of at least one polymerization process parameter and an associated process window, and when a critical time window is present, an adaptation of process conditions is made in order to configure the polymerization process to conform to the process window.