The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2012

Filed:

Jun. 18, 2009
Applicants:

Urara Yokose, Haga-gun, JP;

Akira Hachiya, Haga-gun, JP;

Tsutomu Fujimura, Haga-gun, JP;

Inventors:

Urara Yokose, Haga-gun, JP;

Akira Hachiya, Haga-gun, JP;

Tsutomu Fujimura, Haga-gun, JP;

Assignee:

Kao Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for evaluating or selecting a substance capable of preventing or curing photodamage of skin is provided. Provided is a method for evaluating or selecting an agent for preventing or curing photodamage of skin, the method including: (A) contacting cells that are capable of expressing TIMP-1 gene or TIMP-1 protein, with a test substance; (B) measuring the expression level of the TIMP-1 gene or the TIMP-1 protein in the cells; (C) comparing the expression level obtained in (B), with the expression level of TIMP-1 gene or TIMP-1 protein in a control group in which the cells capable of expressing TIMP-1 gene or TIMP-1 protein have not been contacted with the test substance; and (D) evaluating or selecting the test substance which increases the expression level of TIMP-1 gene or TIMP-1 protein, as an agent for preventing or curing photodamage of skin, based on the results of (C).


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