The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Aug. 01, 2008
Frank M. Haran, North Vancouver, CA;
Payam Mousavi, Coquitlam, CA;
David Jez, Vancouver, CA;
Steven Dodge, Burnaby, CA;
Frank M. Haran, North Vancouver, CA;
Payam Mousavi, Coquitlam, CA;
David Jez, Vancouver, CA;
Steven Dodge, Burnaby, CA;
Honeywell ASCA Inc., Mississauga, Ontario, CA;
Abstract
An in-situ time domain spectroscopy (TDS)-based method () for non-contact characterization of properties of a sheet material while being produced by a manufacturing system (). A time domain spectrometry system () and calibration data for the system is provided. The calibration data includes data for transmitted power through or reflected power from the sheet material as a function of a moisture content of the sheet material. At least one pulse of THz or near THz radiation from a transmitter () is directed at a location on a sheet material sample () while being processed by the manufacturing system (). Transmitted or reflected radiation associated with at least one transmitted or reflected pulse from the sample location is synchronously detected by a detector () to obtain the sample data. The sample data, which is coincident data, is processed together with the calibration data () to determine at least one, and generally a plurality of properties of the sheet material sample () selected from caliper, basis weight and moisture content.