The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Nov. 07, 2006
Applicants:

Thomas J. Ball, Mercer Island, WA (US);

Yuan Yu, Cupertino, CA (US);

Shuvendu K. Lahiri, Redmond, WA (US);

Inventors:

Thomas J. Ball, Mercer Island, WA (US);

Yuan Yu, Cupertino, CA (US);

Shuvendu K. Lahiri, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A library or application is selected comprising one or more functions or methods. An interesting subset of the functions or methods is created. A plurality of multi-threaded test cases are generated from the subset of interesting functions or methods, with each test case comprising a unique pair or triple of functions or methods from the subset. The resulting set of test cases may then be filtered of thread safe test cases using static analysis techniques. The filtered set of test cases is then used as an input to a specialized application that executes each of the multi-threaded test cases to detect atomicity violations and race conditions. The results of the execution of each of the test cases by the specialized application are then aggregated and presented to a user or administrator in a report, for example.


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