The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Apr. 05, 2010
Applicants:

Haifeng Chen, Old Bridge, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Kenji Yoshihira, Princeton Junction, NJ (US);

Akhilesh Saxena, Morristown, NJ (US);

Inventors:

Haifeng Chen, Old Bridge, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Kenji Yoshihira, Princeton Junction, NJ (US);

Akhilesh Saxena, Morristown, NJ (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method system for diagnosing a detected failure in a computer system, compares a failure signature of the detected failure to an archived failure signature contained in a database to determine if the archived failure signature matches the failure signature of the detected failure. If the archived failure signature matches the failure signature of the detected failure, an archived solution is applied to the computer system that resolves the detected failure, the archived solution corresponding to a solution used to resolve a previously detected computer system failure corresponding to the archived failure signature in the database that matches the detected failure.


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