The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Oct. 31, 2003
Applicants:

Jerry Z. Shan, Palo Alto, CA (US);

Evan R. Kirshenbaum, Mountain View, CA (US);

Henri J. Suermondt, Sunnyvale, CA (US);

Dirk Beyer, Walnut Creek, CA (US);

Chao Chen, Berkeley, CA (US);

Inventors:

Jerry Z. Shan, Palo Alto, CA (US);

Evan R. Kirshenbaum, Mountain View, CA (US);

Henri J. Suermondt, Sunnyvale, CA (US);

Dirk Beyer, Walnut Creek, CA (US);

Chao Chen, Berkeley, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for detecting an interesting event in a data stream. More specifically, a monitoring system is configured to monitor a data stream and establish a sensitivity parameter based on sequences generated from values in a first portion of the data stream. A detector may be trained using the sensitivity parameter to detect the occurrence of an interesting event in the data stream.


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