The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Apr. 04, 2007
Applicants:

Stephen W. Leonard, Unionville, CA;

Samad Talebpour, Richmond Hill, CA;

Inventors:

Stephen W. Leonard, Unionville, CA;

Samad Talebpour, Richmond Hill, CA;

Assignee:

Novx Systems Canada Inc., Richmond Hills, ON, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Assays and methods of compensating for changes in a dose-response curve of an assay due to variations in a perturbing variable by firstly measuring the dose-response curve, the individual assay parameters, at different values of the perturbing variable. Next, unknown samples are assayed simultaneously with a known standard at a chosen analyte concentration with a value of the perturbing variable being unknown and the dose-response curve unknown. The different dose-response curves from the first step are used to determine a mathematical relationship between assay parameters and the assay signal of the known standard. The assay parameters that are valid for the unknown value of the perturbing variable can be obtained by substituting the value of the assay signal from the known standard into the mathematical relationship and solving for the assay parameters.


Find Patent Forward Citations

Loading…