The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Jan. 19, 2006
Stephen W. Leonard, Unionville, CA;
Samad Talebpour, Richmond Hill, CA;
Stephen W. Leonard, Unionville, CA;
Samad Talebpour, Richmond Hill, CA;
Novx Systems Canada Inc., Richmond Hill, ON, CA;
Abstract
The present invention provides assays and methods of compensating for changes in an assay where such changes are due to variations in a perturbing variable. This is achieved by a two-step method, the first step of which involves measurements of the dose-response curve, and thus the individual assay parameters, at different values of the perturbing variable. In the second step, unknown samples are assayed simultaneously with a standard. During this measurement, the value of the perturbing variable is unknown and the dose-response curve is therefore also unknown. The dose-response curves from the first step are used to determine a mathematical relationship between the assay parameters and the assay signal of the standard. Assay parameters that are valid for the unknown value of the perturbing variable can be obtained by substituting the value of the assay signal from the standard into the mathematical relationship and solving for the assay parameters.