The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Mar. 05, 2004
Kam Lin Wong, Bedford, MA (US);
Louise Isenstein, Carlisle, MA (US);
David Zahniser, Wellesley, MA (US);
Kam Lin Wong, Bedford, MA (US);
Louise Isenstein, Carlisle, MA (US);
David Zahniser, Wellesley, MA (US);
Cytyc Corporation, Marlborough, MA (US);
Abstract
Methods, systems, and computer software for determining the stain quality of a plurality of biological specimens. A number of objects of interest are identified in a biological specimen. A first feature of each object of interest (e.g., nuclear area) and a second feature of each object of interest (e.g., nuclear integrated optical density) are measured, and a scatter plot of the first and second features is generated. The stain quality of the specimens are determined based on the distribution of points within the scatter plot.