The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Jan. 11, 2010
Sugato Bagchi, Yorktown Heights, NY (US);
Lindsay E. Burns, Hopewell Junction, NY (US);
Steven C. Catlett, Hopewell Junction, NY (US);
Ching-hua Chen-ritzo, Yorktown Heights, NY (US);
Sugato Bagchi, Yorktown Heights, NY (US);
Lindsay E. Burns, Hopewell Junction, NY (US);
Steven C. Catlett, Hopewell Junction, NY (US);
Ching-Hua Chen-Ritzo, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A first linear combination of a local moving aggregated quantity derived from a WIP distribution and a global aggregated quantity derived from the WIP distribution is calculated for each range for a given product type in a manufacturing line. The first linear combination serves as a first throughput target for the range and product. A second linear combination of a standard deviation of the non-zero portion of the WIP distribution and the global aggregated quantity is calculated for the product type in the manufacturing line. The coefficients of this second linear combination are predetermined. This second linear combination serves as a second throughput target. A throughput target for each range is determined by determining the minimum of the first throughput target, which can be different for each range, and the second throughput target, which is common across all ranges.