The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
May. 12, 2008
Joerg Weigang, Dresden, DE;
Robert Ringel, Dresden, DE;
Steffen Kalisch, Radebeul, DE;
Thomas Quarg, Moritzburg, DE;
Joerg Weigang, Dresden, DE;
Robert Ringel, Dresden, DE;
Steffen Kalisch, Radebeul, DE;
Thomas Quarg, Moritzburg, DE;
Globalfoundries Inc., Grand Cayman, KY;
Abstract
By defining a section-related WIP limit or a throughput-related WIP limit, an efficient 'look ahead' characteristic may be established to efficiently control the WIP in a complex manufacturing environment, such as a semiconductor facility. The respective critical WIP values may enable efficient reduction of priority of products moving towards an increased WIP queue, thereby reducing or substantially avoiding the release of products that are expected to run into the WIP queue. In this way, the efficiency of shared tools may be increased, since process capacity no longer required for the processing products running into WIP queues may be allocated for other operations.