The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

May. 27, 2009
Applicants:

Michael Nicholas Soures, Webster, NY (US);

James Joseph Petery, Webster, NY (US);

Timothy D. Thomas, Fairport, NY (US);

Jeffrey Gramowski, North Chili, NY (US);

Cheryl Marie Koenig, Ontario, NY (US);

Robert Steven Pozniakas, Rochester, NY (US);

David R. Kamprath, Webster, NY (US);

Stephen F. Randall, West Henrietta, NY (US);

Kathleen Spencer, Webster, NY (US);

Nitin Shenoy, Webster, NY (US);

Joanna Brown, Fairport, NY (US);

Christina Dimarco, Rochester, NY (US);

Nancy Kelly, Irondequoit, NY (US);

Bernard N. Hakac, Webster, NY (US);

Cheng-ning Jong, North Chili, NY (US);

Nate Weldon, Rochester, NY (US);

Inventors:

Michael Nicholas Soures, Webster, NY (US);

James Joseph Petery, Webster, NY (US);

Timothy D. Thomas, Fairport, NY (US);

Jeffrey Gramowski, North Chili, NY (US);

Cheryl Marie Koenig, Ontario, NY (US);

Robert Steven Pozniakas, Rochester, NY (US);

David R. Kamprath, Webster, NY (US);

Stephen F. Randall, West Henrietta, NY (US);

Kathleen Spencer, Webster, NY (US);

Nitin Shenoy, Webster, NY (US);

Joanna Brown, Fairport, NY (US);

Christina DiMarco, Rochester, NY (US);

Nancy Kelly, Irondequoit, NY (US);

Bernard N. Hakac, Webster, NY (US);

Cheng-Ning Jong, North Chili, NY (US);

Nate Weldon, Rochester, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diagnostic system made part of or for use with a document handling device in which a customer is guided toward performance of at least one comparison means in a diagnostic routine analysis. The comparison means is selected from a group comprising (1) a first comparison comparing a fused print media and an unfused print media for presence of a defect, (2) a second comparison comparing an output print media and at least one image on a screen for a type of defect, and (3) a third comparison comparing a low-charged print media and a no-charged print media for qualities of the defect. The customer enters a selection based on results of the first, the second, or the third comparisons. The diagnostic system can identify a part causing a defect in the print media based on results of the comparisons.


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