The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Dec. 04, 2007
Applicants:

Gianfranco Doretto, Albany, NY (US);

Xiaogang Wang, Cambridge, MA (US);

Thomas B. Sebastian, Flemington, NJ (US);

Jens Rittscher, Ballston Lake, NY (US);

Peter H. Tu, Niskayuna, NY (US);

Inventors:

Gianfranco Doretto, Albany, NY (US);

Xiaogang Wang, Cambridge, MA (US);

Thomas B. Sebastian, Flemington, NJ (US);

Jens Rittscher, Ballston Lake, NY (US);

Peter H. Tu, Niskayuna, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and method for efficient computation of statistical information, such as a mean, co-variance, or histogram of the image pixels, over discrete image regions. The computation employs integral computations to determine the statistical information over image regions of arbitrary shape, including irregular polygonal shaped regions. The integral computations are simplified by categorizing corner points of boundaries of image regions. The computation can be applied to calculate descriptors or signatures of persons or objects within an image. The computation also has a low computational cost enabling fast calculation of image statistics.


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