The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Jun. 05, 2008
Makoto Hayasaki, Tokyo, JP;
Makoto Hayasaki, Tokyo, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
There are provided: a pattern detection process section for extracting a partial image made of pixels including a target pixel from input image data; a rotated image generating section for generating a self-rotated image by rotating the partial image; and a matching test determination section for determining whether an image pattern included in the partial image matches an image pattern included in the self-rotated image. When it is determined that matching exists, a target pixel in the partial image or a block made of pixels including the target pixel is regarded as a feature point. Consequently, even when image data has been read while skewed with respect to a predetermined positioning angle of a reading position of an image reading apparatus or image data has been subjected to enlarging, reducing etc., a feature point properly specifying the image data can be extracted regardless of skew, enlarging, reducing etc.