The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Mar. 31, 2009
Donald A. Hallock, Poughkeepsie, NY (US);
Vincent P. Mulligan, Wappingers Falls, NY (US);
Joseph P. Paul, Hopewell Junction, NY (US);
James I. Paradies, Clintondale, NY (US);
Nandu N. Ranadive, Wappingers Falls, NY (US);
Donald A. Hallock, Poughkeepsie, NY (US);
Vincent P. Mulligan, Wappingers Falls, NY (US);
Joseph P. Paul, Hopewell Junction, NY (US);
James I. Paradies, Clintondale, NY (US);
Nandu N. Ranadive, Wappingers Falls, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system to facilitate analysis of component leads is provided and includes a device to form a picture of the leads, from which an image is extracted, to apportion the image and to perform first and second scans of the portions, and a processor, including a memory unit having a set of computer-readable executable instructions stored thereon, which, when executed, cause the processor to receive data of each scan, to establish a rule, based on the data of the first scan of any one portion, governing when to judge that the data of the second scan of the one portion indicates a defect, to determine rule compliance for each of the second scans, to judge that any one second scan in a non-compliance state indicates a defect, and to report a location of the defect. A display unit displays the report to a user.