The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Aug. 15, 2008
Applicants:
Ali Khamene, Princeton, NJ (US);
Oliver Fluck, Plainsboro, NJ (US);
Shmuel Aharon, West Windsor, NJ (US);
Inventors:
Ali Khamene, Princeton, NJ (US);
Oliver Fluck, Plainsboro, NJ (US);
Shmuel Aharon, West Windsor, NJ (US);
Assignee:
Siemens Aktiengesellschaft, München, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for deformable registration including determining a vector field from a two-dimensional matching of a volume of an object of interest and a two-dimensional image of the object of interest, providing a deformation profile, and finding a volume deformation that maps to a state of the two-dimensional image, wherein the deformation is parameterized by the vector field and control points of the deformation profile to find a control point configuration of the volume deformation.