The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Aug. 14, 2009
Applicant:

Pengrui Zhang, Shenzhen, CN;

Inventor:

Pengrui Zhang, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 1/24 (2006.01); H04M 3/08 (2006.01); H04M 3/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A line measurement method is provided. The method includes obtaining data of relation between a line length and an insertion loss phase radian, and obtaining data of relation between the line length and a loop attenuation parameter value; obtaining four length values from the data of relation between the line length and the insertion loss phase radian, and defining a length range to obtain the first and the second length range; and determining the boundary of the second length range close to a midpoint of the first length range, using a line length value corresponding to the boundary close to the midpoint as a measured line length, and using a line diameter corresponding to the line length value as a measured line diameter.


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