The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Jun. 05, 2009
Timothy R. Fox, Chicago, IL (US);
Gongyin Chen, Henderson, NV (US);
Kevin M. Holt, Chicago, IL (US);
Paul J. Bjorkholm, Newport Beach, CA (US);
David T. Nisius, Des Plaines, IL (US);
Timothy R. Fox, Chicago, IL (US);
Gongyin Chen, Henderson, NV (US);
Kevin M. Holt, Chicago, IL (US);
Paul J. Bjorkholm, Newport Beach, CA (US);
David T. Nisius, Des Plaines, IL (US);
Varian Medical Systems, Inc., Palo Alto, CA (US);
Abstract
At least three radiation-detection views are used to facilitate identifying material as comprises an object being assessed along a beam path relative to that object. This comprises developing a first radiation-detection view () as corresponds to the material along the beam path, a second radiation-detection view () as corresponds to the material along substantially the beam path, and at least a third radiation-detection view () as corresponds to the material along substantially the beam path. At least one of the source spectra and detector spectral responses used for these radiation-detection views are different from one another for each view. One then uses () these radiation-detection views to identify the material by, at least in part, differentiating the material from other possible materials.