The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Dec. 10, 2008
Applicants:

Debasish Mishra, Bangalore, IN;

William Robert Ross, Rotterdam, NY (US);

Thomas James Batzinger, Burnt Hills, NY (US);

Manoharan Venugopal, Bangalore, IN;

Forrest Frank Hopkins, Cohoes, NY (US);

Nityanand Gopalika, State College, PA (US);

Vamshi Krishna Reddy Kommareddy, Bangalore, IN;

Rajashekar Venkatachalam, Bangalore, IN;

Prasad Thapa, Bangalore, IN;

Inventors:

Debasish Mishra, Bangalore, IN;

William Robert Ross, Rotterdam, NY (US);

Thomas James Batzinger, Burnt Hills, NY (US);

Manoharan Venugopal, Bangalore, IN;

Forrest Frank Hopkins, Cohoes, NY (US);

Nityanand Gopalika, State College, PA (US);

Vamshi Krishna Reddy Kommareddy, Bangalore, IN;

Rajashekar Venkatachalam, Bangalore, IN;

Prasad Thapa, Bangalore, IN;

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging technique is provided for acquiring scatter free images of an object. The technique includes acquiring a plurality of projection images of the object using a source and a detector oriented at a plurality of projection angles relative to the object, and generating a plurality of scatter free projection images by correcting the plurality of projection images based on respective ones of a plurality of stored scatter images. The scatter images are generated and stored for each of the projection angles by positioning a scatter rejection plate between the object and the detector. The technique further includes reconstructing a three-dimensional image of the object based on the scatter free projection images.


Find Patent Forward Citations

Loading…