The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Mar. 06, 2007
Noriaki Matsuno, Tokyo, JP;
Kiyoshi Yanagisawa, Tokyo, JP;
Noriaki Matsuno, Tokyo, JP;
Kiyoshi Yanagisawa, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
Test signal generator () generates test signals represented, by four points, which comprise two sets of two points positioned in point symmetry with respect to the origin of an I/Q orthogonal coordinate system. Envelope detector () detects the amplitude of an envelope of the output signal from an orthogonal modulator when the test signals represented by four points are generated, and outputs a signal proportional to the square of the amplitude. Comparing unit () calculates an average value of output signals from envelope detector ( ) when the test signals represented by the two points of each set are generated. Controller () adjusts the amplitudes and/or phases of the test signals so that the average values produced when the test signals represented by the two sets of the two points are generated are equal to each other, and calculates an I/Q mismatch quantity based on the adjusted results.