The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Sep. 28, 2006
Applicants:

Kazuhisa Sunaga, Tokyo, JP;

Kouichi Yamaguchi, Tokyo, JP;

Muneo Fukaishi, Tokyo, JP;

Inventors:

Kazuhisa Sunaga, Tokyo, JP;

Kouichi Yamaguchi, Tokyo, JP;

Muneo Fukaishi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A common mode of a waveform of a duobinary transmission signal (IN) is set to 0 and the size of a data eye is set to Veye; and reference potentials Vref_H and Vref_L are set to the following values:eye/√{square root over (3)}≦refeye/√{square root over (2)}  (1)−eye/√{square root over (2)}≦refeye/√{square root over (3)}  (2) More particularly, effect becomes remarkable by setting the reference potentials Vref_H and Vref_L to central values in ranges shown in Equations (1) and (2), respectively. In the central values, fluctuation (jitter) of transition data becomes the smallest, and a jitter characteristic of a reproducing clock becomes the best. Consequently, a clock reproducing apparatus in which a received clock from duobinary transmission data is reproduced with high accuracy is provide.


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