The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

May. 18, 2009
Applicants:

Christopher P. Turcotte, Brookfield, IL (US);

Kevin M. Haynes, Lombard, IL (US);

Inventors:

Christopher P. Turcotte, Brookfield, IL (US);

Kevin M. Haynes, Lombard, IL (US);

Assignee:

Magnetrol International, Incorporated, Downers Grove, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A process measurement instrument with target rejection comprises a sensor circuit. The sensor circuit comprises a drive circuit for transmitting a pulse signal at a target of interest and a receive circuit receiving reflected echoes of the pulse signal and developing an analog receive signal representative of the reflected echoes. An analog processing circuit receives the analog receive signal and comprises a summer subtracting an analog target rejection signal from the analog receive signal to develop a corrected receive signal. A programmed digital processing circuit is operatively coupled to the analog processing circuit and comprises a memory storing target rejection signal value data representing false target reflections and developing the analog target rejection signal for transfer to the analog processing circuit.


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