The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Sep. 27, 2007
Applicant:

Youichi Yamazaki, Kagoshima, JP;

Inventor:

Youichi Yamazaki, Kagoshima, JP;

Assignee:

Kyocera Corporation, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/06 (2006.01); C04B 35/468 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a multilayer ceramic capacitor which has a dielectric ceramic having a dielectric layer, wherein the dielectric layer mainly comprises barium titanate, contains a crystalline particle having an average crystal diameter of 0.15 to 0.3 μm, and contains Mg in an amount of 0.5 to 2 parts by mol in terms of MgO, Mn in an amount of 0.2 to 0.5 part by mol in terms of MnO, and a first rare earth element (RE) selected from Ho, Y, Er, Tm, Yb and Lu and a second rare earth element (RE) selected from Sm, Eu, Gd, Tb and Dy in a total amount of 0.7 to 3 parts by mol in terms of REOrelative to 100 parts by mol of barium titanate, the crystalline particle contains the first rare earth element and the second rare earth element in such a manner that the amount of the first rare earth element is larger than that of the second rare earth element, and the density gradients of the first rare earth element and the second rare earth element in the crystalline particle as determined from the particle boundary toward the center of the crystalline particle are −0.005 to −0.05 atm %/mm and −0.0005 to −0.005 atm %/mm, respectively. Also disclosed is a method for producing the multilayer ceramic capacitor.


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