The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Oct. 20, 2008
Applicants:

Jannick P. Rolland, Chuluota, FL (US);

Kevin P. Thompson, Pittsford, NY (US);

Supraja Murali, Oviedo, FL (US);

Inventors:

Jannick P. Rolland, Chuluota, FL (US);

Kevin P. Thompson, Pittsford, NY (US);

Supraja Murali, Oviedo, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical system suitable for use in an optical instrument such as a handheld optical probe, the optical system including a scanning element and an objective, the objective including a variable focus lens that can be electronically controlled to change the focal length of the optical system. In some embodiments, the optical system can axially and laterally scan a subject material by sequentially focusing at an axial depth using the variable focus lens and laterally scanning the material at that depth using the scanning element.


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