The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Oct. 31, 2007
Applicants:

Satoshi Sakai, Kanagawa, JP;

Yoichiro Tsumura, Hiroshima, JP;

Masami Iida, Nagasaki, JP;

Kohei Kawazoe, Nagasaki, JP;

Inventors:

Satoshi Sakai, Kanagawa, JP;

Yoichiro Tsumura, Hiroshima, JP;

Masami Iida, Nagasaki, JP;

Kohei Kawazoe, Nagasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/28 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Objects are to reduce the burden on an operator and to improve fabrication efficiency. A transparent conductive film or a transparent optical film formed on a substrate W is irradiated with line illumination light by means of a line illumination device, line reflected light reflected at the transparent conductive film or the transparent optical film is detected with a camera, a color evaluation value of the detected reflected light is measured, and a film thickness corresponding to the measured color evaluation value is obtained using a film-thickness characteristic in which the color evaluation value is associated with the film thickness.


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