The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
May. 21, 2009
Gabriel Popescu, Champaign, IL (US);
Zhuo Wang, Urbana, IL (US);
Gabriel Popescu, Champaign, IL (US);
Zhuo Wang, Urbana, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
Methods and apparatus for rendering quantitative phase maps across and through transparent samples. A broadband source is employed in conjunction with an objective, Fourier optics, and a programmable two-dimensional phase modulator to obtain amplitude and phase information in an image plane. Methods, referred to as Fourier transform light scattering (FTLS), measure the angular scattering spectrum of the sample. FTLS combines optical microscopy and light scattering for studying inhomogeneous and dynamic media. FTLS relies on quantifying the optical phase and amplitude associated with a coherent image field and propagating it numerically to the scattering plane. Full angular information, limited only by the microscope objective, is obtained from extremely weak scatterers, such as a single micron-sized particle. A flow cytometer may employ FTLS sorting.