The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Mar. 27, 2008
Michael L. Myrick, Irmo, SC (US);
Robert P. Freese, Pittsboro, NC (US);
John Blackburn, Charleston, SC (US);
David L. Perkins, Irmo, SC (US);
Leonard Zheleznyak, Pittsford, NY (US);
Ryan Priore, Wexford, PA (US);
Michael L. Myrick, Irmo, SC (US);
Robert P. Freese, Pittsboro, NC (US);
John Blackburn, Charleston, SC (US);
David L. Perkins, Irmo, SC (US);
Leonard Zheleznyak, Pittsford, NY (US);
Ryan Priore, Wexford, PA (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
The present subject matter relates to multivariate optical analysis systems employ multivariate optical elements and utilize multivariate optical computing methods to determine information about a product carried by light reflected from or transmitted through the product. An exemplary method of processing and monitoring the product includes introducing the product at an inspection point; illuminating the product with a spectral-specific light though an optic lens; directing the light that has passed through at least a section of the product through at least one multivariate optical element to produce a first signal, the directed light carrying information about the product; detecting the signal at a detector; and determining at least one property of the product based upon the detector output.