The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Jun. 16, 2009
Daniel Feldkhun, Boulder, CO (US);
Daniel Feldkhun, Boulder, CO (US);
The Regents of the University of Colorado, a Body Corporate, Denver, CO (US);
Abstract
Methods, systems, and apparatuses are provided for measuring one or more sinusoidal Fourier components of an object. A structured second radiation is generated by spatially modulating a first radiation. The structured second radiation illuminates the object, The structured second radiation is scaled and oriented relative to the object. The object produces a third radiation in response to the illuminating. A single-element detector detects a portion of the third radiation from multiple locations on the object substantially simultaneously for each spatial modulation of the first radiation and for each orientation of the second radiation. A time-varying signal is produced based on said detected portion of the third radiations. One or more characteristics of the one or more sinusoidal Fourier components of the object are estimated based on the time-varying signal.