The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
May. 21, 2008
Garry Chinn, San Mateo, CA (US);
Craig S. Levin, Palo Alto, CA (US);
Angela M. Foudray, San Jose, CA (US);
Garry Chinn, San Mateo, CA (US);
Craig S. Levin, Palo Alto, CA (US);
Angela M. Foudray, San Jose, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
Methods and systems for producing an image. Measurement data is obtained for a coincidence photon event, and a line projector function is generated based on the obtained measurement data. Additional measurement data is obtained for a single photon event, and a cone-surface projector function is generated based on the additional measurement data. An image is reconstructed using the generated line projector function and the generated cone-surface projector function. In another example method for producing an image, a measurement is obtained, and a projector function is generated using the obtained measurement. The generated projector function is modified based on an a priori image. An image is reconstructed using the modified projector function.